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This book presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. It brings the results in the direction of merging manufacturing test vector generation and verification.

Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.

The modern electronic testing has a forty year history. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook.

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications.