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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysisav ASM International
Om ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

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  • Språk:
  • Engelsk
  • ISBN:
  • 9781627081504
  • Bindende:
  • Paperback
  • Sider:
  • 660
  • Utgitt:
  • 30 januar 2018
  • Dimensjoner:
  • 152x229x0 mm.
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 12 oktober 2024

Beskrivelse av ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

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