Utvidet returrett til 31. januar 2025

Radiation-induced Soft Error

- A Chip-level Modeling

Om Radiation-induced Soft Error

A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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  • Språk:
  • Engelsk
  • ISBN:
  • 9781601983947
  • Bindende:
  • Paperback
  • Sider:
  • 136
  • Utgitt:
  • 27. november 2010
  • Dimensjoner:
  • 157x234x8 mm.
  • Vekt:
  • 210 g.
  • BLACK NOVEMBER
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 11. desember 2024

Beskrivelse av Radiation-induced Soft Error

A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

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