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Transmission Electron Microscopy in Micro-nanoelectronics

Om Transmission Electron Microscopy in Micro-nanoelectronics

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs.

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  • Språk:
  • Engelsk
  • ISBN:
  • 9781848213678
  • Bindende:
  • Hardback
  • Sider:
  • 264
  • Utgitt:
  • 18. desember 2012
  • Dimensjoner:
  • 240x162x23 mm.
  • Vekt:
  • 592 g.
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 10. februar 2025

Beskrivelse av Transmission Electron Microscopy in Micro-nanoelectronics

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs.

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