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Digital Holography for MEMS and Microsystem Metrology

Om Digital Holography for MEMS and Microsystem Metrology

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

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  • Språk:
  • Engelsk
  • ISBN:
  • 9780470978696
  • Bindende:
  • Hardback
  • Sider:
  • 232
  • Utgitt:
  • 28. juli 2011
  • Dimensjoner:
  • 164x237x19 mm.
  • Vekt:
  • 486 g.
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 27. januar 2025

Beskrivelse av Digital Holography for MEMS and Microsystem Metrology

By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

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